Measurement of Wide Bandgap Power Devices

#Wide-Bandgap #(WBGT) #Gallium #Nitride #(GaN) #Silicon #Carbide #(SiC) #Power #Devices
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IEEE North Jersey Section Co-Sponsors the Talk: "Digital Pre-Distortion Techniques for EVM"

 


This webinar comprehensively explores the challenges involved in measuring Wide-Bandgap (WBG) power devices, with practical examples for illustration. It will cover the key measurement methods, equipment, and probes to accurately capture relevant signals. Energy conversion, from generation to consumption, involves several transformations, each presenting unique challenges. As the demand for efficient energy transmission increases, new semiconductor technologies such as Gallium Nitride (GaN) and Silicon Carbide (SiC) are being developed to address these needs. These Wide-Bandgap (WBG) technologies offer higher switching frequencies, reduced power losses, and improved transmission capabilities. However, these advancements also bring new measurement challenges. This session will explore the measurement techniques and best practices necessary for characterizing transistor switching circuits, including critical current and voltage measurements on the high-side transistor of a WBG power system.

 

 

 

 

 

 



  Date and Time

  Location

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  • Date: 28 May 2025
  • Time: 05:00 PM UTC to 06:00 PM UTC
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  • Contact Event Hosts
  • Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Durga Mishra (dmisra@njit.edu), (Anisha Apte (anisha_apte@ieee.org), Amrita Poddar (amritapoddar@ieee.org)

     

     

     

     

     

     

     

     

     

     

     

  • Co-sponsored by IEEE North Jersey Section


  Speakers

Marcus Sonst of Rohde & Schwarz

Topic:

Measurement of Wide Bandgap Power Devices

In this webinar, you will learn about the following key topics:

1. How to select differential high-voltage probes with high bandwidth and an excellent common-mode rejection ratio, which are essential for accurately capturing gate-source and shunt-current signals on high-side switches.

2. Techniques for de-skewing voltage and current probes to time-align their signals, ensuring trustworthy dynamic power calculations.

3. How to recognize and mitigate layout- and probe-induced parasitics that can cause ringing, overshoot, and other waveform distortions.

4. Proven measurement best practices that will help you convert these techniques into clean, reliable data for wide-bandgap power designs.

 

 

 

Biography:

Marcus holds a master’s degree in electrical engineering focusing on energy and power from the University of Applied Sciences in Dortmund (Germany). He has more than 20 years of experience developing, designing, and testing power supplies and electronic ballasts. Today, he is an application development engineer at Rohde & Schwarz and is responsible for power management and power electronics tests, with a focus on time-domain measurements.

 

 

 

Address:Rohde & Schwarz,