[IEEE EMC Distinguished Lecture] How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range
IEEE Electromagnetic Compatibility (EMC) Society Distinguished Lecture
Please join us for an upcoming lecture on 2 June 2025 at 3 – 4 pm (Eastern Time) by Dr. Benoit Derat, Senior Director for Systems Developments and Project Implementations, at Rohde & Schwarz, Munich, Germany.
Date: Monday, 2 June 2025
Time: 3:00 PM to 4:00 PM (EST)
Location: Room BA 2135, Bahen Centre for Information Technology, 40 St George St, Toronto
How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range
Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.
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- Date: 02 Jun 2025
- Time: 07:00 PM UTC to 08:00 PM UTC
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- 40 St George Street
- Toronto, Ontario
- Canada M5S 2E4
- Building: Bahen Centre for Information Technology
- Room Number: BA 2135
- Starts 13 May 2025 04:00 AM UTC
- Ends 02 June 2025 04:00 AM UTC
- No Admission Charge
Speakers
Benoit Derat of Rohde & Schwarz, Munich
How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range
Biography:
Benoit Derat received the Engineering degree from SUPELEC, in 2002, and the Ph.D. degree (Hons.) in physics from the University of Paris XI, in 2006. From 2002 to 2008, he worked at SAGEM Mobiles, as an Antenna Design and Electromagnetics Research Engineer. In 2009, he founded ART-Fi, which created the first vector-array specific absorption rate measurement system. He operated as the CEO and the President of ART-Fi, before joining Rohde & Schwarz, Munich, in 2017. He is currently the Senior Director of Engineering for Vector Network Analyzers, Electromagnetic Compatibility, Over-The-Air and Antenna Test applications. Dr. Derat is a Senior Member of the Antenna Measurement Techniques Association (AMTA) and a Distinguished Lecturer of the IEEE EMC Society (2024 – 2025). He is the author of more than 80 scientific journals and conference papers, and an inventor on more than 40 patents, with main focus in antenna systems near and far-field characterization techniques.